Summary
This paper presents a very simple approach to semi-supervised learning that utilizes both labeled and unlabeled datasets. When there is a large amount of unlabeled data available, following the same distribution as the labeled dataset, the most effective method to leverage this unlabeled data for training is self-training, where pseudo labels are generated and used for training. The main limitation of self-training is that the performance can degrade when the pseudo-labels produced by the predictor for the unlabeled set are not accurate.
In this paper, the authors propose a very simple method to overcome this limitation by replacing the conventional loss for the labeled dataset and the unlabeled dataset in self-training. This modification allows the model to be trained effectively in both cases, whether the pseudo-labels are correct or not, leading to improved performance in all scenarios. The effectiveness of this approach is experimentally demonstrated on image classification benchmarks and 3D object detection benchmarks.
Strengths
Overall, the method is very simple, intuitive, and quite novel. The paper is well-written and it provides a well-derived explanation using equations for both cases where the pseudo labels are accurate and when they are not. Additionally, the method is thoroughly analyzed from a theoretical perspective.
Weaknesses
Although the theoretical derivation demonstrates the soundness of the method, there is doubt regarding its effectiveness in experiments.
1. Especially, in the experiments (sec. 3.1), the authors use curriculum-based loss in each epoch. With $\alpha_t < 1 $, the proposed method will behave like self-training (exactly when $\alpha_t = \frac{n}{m+n}$) and the behavior/effectiveness of the proposed method could not be well represented in this case.
2. Image classification experiments were conducted using ImageNet-100. However, when the labeled set ratio is 100%, the top-1 accuracy of DaVIT and ResNet50 is remarkably lower at 47.8% and 46.7%, respectively, compared to the reported top-1 accuracy in other papers. Following the paper of DaVit and ResNet, the top-1 accuracy on the more complex task of ImageNet1k, compared to ImageNet-100, using DaVit-tiny and ResNet is 82.8% and 79.26%, respectively. Following [1], the top-1 accuracy of various resnet50-based methods for ImageNet-100 consistently surpasses 70%. It appears that the baseline has not been sufficiently well-trained.
3. There is a lack of comparison with other semi-supervised methods. While this method compares with the basic self-training loss, it is necessary to compare it with various methods that utilize pseudo-labels for self-training [2], [3], [4]. Most semi-supervised image classification methods have performed experiments on benchmark datasets such as ImageNet1k and CIFAR100. These methods achieve a top-1 accuracy of 72% or higher when using a labeled dataset of 10% on ImageNet1k. Therefore, it is necessary to compare the effectiveness of this method on these benchmark datasets.
4. Similarly, in semi-supervised 3D object detection, it is necessary to compare the results with existing baseline methods [5], [6].
5. Although this paper proposes a method for the distribution mismatch case in Section 2.4, estimating the probability values of each sample, p(x) and q(x), for each distribution is not easy. Practical methods for this issue have not been provided, and experiments on this aspect are also lacking. Practical algorithms and experiments need to be provided in order to address this concern.
[1] Zelin Zang, et al. DLME: Deep Local-flatness Manifold Embedding. ECCV 2022
[2] Qizhe Xie, Zihang Dai, Eduard Hovy, Minh-Thang Luong, and Quoc V. Le. Unsupervised data augmentation for consistency training. In Advances in Neural Information Processing Systems, 2020
[3] Kihyuk Sohn, David Berthelot, Zizhao Li, Chun-Liang Zhang, Nicholas Carlini, Ekin D. Cubuk, Alex Kurakin, Han Zhang, and Colin Raffel. Fixmatch: Simplifying semi-supervised learning with consistency and confidence. In IEEE Conference on Computer Vision and Pattern Recognition, 2020
[4] Hieu Pham, Qizhe Xie, Zihang Dai, and Quoc V Le. Meta pseudo labels. In IEEE Conference on Computer Vision and Pattern Recognition, 2021
[5] He Wang, Yezhen Cong, Or Litany, Yue Gao and Leonidas J. Guibas. 3DIoUMatch: Leveraging IoU Prediction for Semi-Supervised 3D
Object Detection. In IEEE Conference on Computer Vision and Pattern Recognition, 2021
[6] Na Zhao, Tat-Seng Chua and Gim Hee Lee. SESS: Self-Ensembling Semi-Supervised 3D Object Detection. In IEEE Conference on Computer Vision and Pattern Recognition, 2020
Rating
4: Borderline reject: Technically solid paper where reasons to reject, e.g., limited evaluation, outweigh reasons to accept, e.g., good evaluation. Please use sparingly.
Confidence
4: You are confident in your assessment, but not absolutely certain. It is unlikely, but not impossible, that you did not understand some parts of the submission or that you are unfamiliar with some pieces of related work.