Research on anti single event transient multi-objective optimization technology based on sensitive flip-flop replacement

Abstract

The decreasing characteristic size of transistors leads to a large increase in the Soft Error Rate of circuits. In view of the Single Event Transient generated by the combined circuit, this paper proposes a Triple Modular Redundancy structure Flip-Flop with filtering function to replace the standard Flip-Flop, and the Flip-Flop to be replaced is divided according to the soft error sensitivity. At the same time, aiming at the problem of automatic equalization of various indicators of the generated circuit in the replacement process, this paper explores an optimization architecture based on the "BP-NSGA-III" algorithm, which can automatically determine the position, number and radiation level of the Flip-Flop to be replaced in the circuit, and achieve the comprehensive optimization of the three design indicators of radiation hardening performance, area and power consumption.