SYSTEMS AND METHODS FOR DETERMINING RELATIONSHIPS BETWEEN DEFECTS

Patent №

US 10,620,618

Granted

2020-04-14

Filed 2016

Owner

PALANTIR TECHNOLOGIES INC.

Lab

AI components

4

ml · kr · planning · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

15385664

Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.

Machine learningKnowledge representationPlanningAI hardwareG05B 23/0235G06N 20/00G06Q 10/06395G05B 19/41875G06F 8/65G06F 11/079G06F 11/3688G06F 16/215+6 more

AI classification

Machine learning1.00
Planning1.00
Knowledge representation1.00
AI hardware1.00
Evolutionary computation0.01
Natural language0.01
Speech0.00
Vision0.00

Ownership

PALANTIR TECHNOLOGIES INC.

assignment · 461190693

Assignors

POH, ANDREW, CAVALHEIRO MENCK, ANDREW FREDERICO, SPRAGUE, ARION, GRABHAM, BENJAMIN, LEE, BENJAMIN, RAHILL-MARIER, BIANCA, OMONT, GREGOIRE, INOUE, JIM, SCHEINERMAN, JONAH, ALBIN, MACIEJ, SCOLNICK, MYLES, GRIBELYUK, PAUL, +4 more

On an employer assignment, the assignors are typically the inventors.

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