ULTRASONIC MEASUREMENT AND DETERMINATION OF CRYSTALLOGRAPHIC TEXTURE WITH RESPECT TO POSITION

A technique and device (12) may be utilized to determine a characteristic of a crystallographic texture of a sample (10) based on a detected ultrasonic waveform. The device may be configured to receive ultrasonic waveform data representative of a reflected ultrasonic waveform that propagated through a sample from an ultrasonic detector (14). The device may select a portion of the ultrasonic waveform data and apply a Fast Fourier Transform to the portion of the ultrasonic waveform data to transform the portion from a time domain to a frequency domain. The device then may identify a dominant frequency (98) of the portion in the frequency domain and determine a characteristic of a crystallographic texture for the portion based on the dominant frequency of the portion.