METHOD OF DETERMINING POTENTIAL ANOMALY OF MEMORY DEVICE

A method of determining a potential malfunction of a memory device is executable at a supervisory entity computer communicatively coupled to the memory device. The method includes, over a pre-determined period of time, determining a subset of input/output (I/O) operations having been sent to the memory device for processing, applying at least one counter to determine an actual activity time of the memory device during the pre-determined period of time, applying a pre-determined model to generate an estimate of a benchmark processing time for each one of the subset of transactions, calculating a benchmark processing time for the subset of I/O operations, generating a performance parameter based on the actual activity time and the benchmark processing time, and based on an analysis of the performance parameter, determining if the potential malfunction is present in the memory device.