Learning-Based See-Through Sensing Suitable for Factory Automation

Patent №

US 11,061,388

Granted

2021-07-13

Filed 2019

Owner

MITSUBISHI ELECTRIC RESEARCH LABORATORIES, INC.

Lab

AI components

3

ml · vision · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

16552116

A scanner for image reconstruction of a structure of a target object uses a neural network trained to classify each segment of a sequence of segments of a modified wave into one or multiple classes. The sequence of segments corresponds to the sequence of layers of the target object, such that a segment of modified wave corresponds to a layer having the same index in the sequence of layers as an index of the segment in the sequence of segments. The scanner executes the neural network for each wave modified by penetration through the layers of the target object to produce the classes of segments of the modified waves. Next, the scanner selects the classes of segments of different modified waves corresponding to the same layer to produce an image of the layer of the target object with pixel values being functions of labels of the selected classes.

Machine learningVisionAI hardwareG01S 13/888G05B 19/41875G01N 21/3563G01N 21/3581G01S 7/412G01S 7/417G01S 13/89G05B 13/027+13 more

AI classification

Vision1.00
Machine learning1.00
AI hardware1.00
Knowledge representation0.15
Natural language0.04
Planning0.01
Evolutionary computation0.00
Speech0.00

Ownership

MITSUBISHI ELECTRIC RESEARCH LABORATORIES, INC.

assignment · 545990909

Assignors

WANG, PU, KOIKE-AKINO, TOSHIAKI, ORLIK, PHILIP, BOSE, ARINDAM

On an employer assignment, the assignors are typically the inventors.

© 2026 NYSGPT2525 LLC