PRODUCT DEFECT DETECTION METHOD AND APPARATUS, ELECTRONIC DEVICE AND STORAGE MEDIUM
Patent №
US 11,615,524
Granted
2023-03-28
Filed 2021
Owner
BEIJING BAIDU NETCOM SCIENCE AND TECHNOLOGY CO., LTD.
Lab
—
AI components
4
ml · nlp · vision · hardware
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
17248053
A product defect detection method and apparatus, an electronic device, and a storage medium are provided. A method includes: acquiring a multi-channel image of a target product; inputting the multi-channel image to a defect detection model, wherein the defect detection model includes a plurality of convolutional branches, a merging module and a convolutional headbranch; performing feature extraction on each channel in the multi-channel image by using the plurality of convolutional branches, to obtain a plurality of first characteristic information; merging the plurality of first characteristic information by using the merging module, to obtain second characteristic information; performing feature extraction on the second characteristic information by using the convolutional headbranch, to obtain third characteristic information to be output by the defect detection model; and determining defect information of the target product based on the third characteristic information.
AI classification
Ownership
BEIJING BAIDU NETCOM SCIENCE AND TECHNOLOGY CO., LTD.
assignment · 549520125
Assignors
SU, YE, NIE, LEI, ZOU, JIANFA, HUANG, FENG
On an employer assignment, the assignors are typically the inventors.