ITERATIVE MACHINE LEARNING BASED TECHNIQUES FOR VALUE-BASED DEFECT ANALYSIS IN LARGE DATA SETS
Patent №
US 11,620,558
Granted
2023-04-04
Filed 2020
Owner
AMAZON TECHNOLOGIES, INC.
Lab
AI components
5
ml · nlp · kr · planning · hardware
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
17002274
One or more defect analysis iterations are performed on a collection of records. In a given iteration, a defect presence probability is obtained using a machine learning model for a record group. An estimated audit benefit is then assigned to the record group based at least partly on a defect remediation importance score of the record group. An indication of the estimated audit benefit of the record group is provided to an auditor. An audited defect status for the record group, generated by the auditor, is used to initiate one or more automated actions.
AI classification
Ownership
AMAZON TECHNOLOGIES, INC.
assignment · 536680369
Assignors
XU, YIFAN, WANG, XUE, WICHTERICH, MARC
On an employer assignment, the assignors are typically the inventors.