ITERATIVE MACHINE LEARNING BASED TECHNIQUES FOR VALUE-BASED DEFECT ANALYSIS IN LARGE DATA SETS

Patent №

US 11,620,558

Granted

2023-04-04

Filed 2020

Owner

AMAZON TECHNOLOGIES, INC.

AI components

5

ml · nlp · kr · planning · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

17002274

One or more defect analysis iterations are performed on a collection of records. In a given iteration, a defect presence probability is obtained using a machine learning model for a record group. An estimated audit benefit is then assigned to the record group based at least partly on a defect remediation importance score of the record group. An indication of the estimated audit benefit of the record group is provided to an auditor. An audited defect status for the record group, generated by the auditor, is used to initiate one or more automated actions.

Machine learningNatural languageKnowledge representationPlanningAI hardwareG06N 7/01G06F 18/214G06F 18/217G06N 20/00G06Q 30/0641G06N 3/08G06N 5/01G06N 5/025

AI classification

Planning1.00
Natural language1.00
Machine learning1.00
AI hardware0.97
Knowledge representation0.97
Evolutionary computation0.03
Vision0.01
Speech0.00

Ownership

AMAZON TECHNOLOGIES, INC.

assignment · 536680369

Assignors

XU, YIFAN, WANG, XUE, WICHTERICH, MARC

On an employer assignment, the assignors are typically the inventors.

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