Edge Phase Effects Removal Using Wavelet Correction and Particle Classification Using Combined Absorption and Phase Contrast
Patent №
US 11,645,792
Granted
2023-05-09
Filed 2022
Owner
CARL ZEISS X-RAY MICROSCOPY, INC.
Lab
—
AI components
2
vision · hardware
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
17760892
An x-ray microscopy method that obtains a classification of different particles by distinguishing between different material phases through a combination of image processing involving morphological edge enhancement and possibly resolved absorption contrast differences between the phases along with optional wavelet filtering.
VisionAI hardwareG06T 11/008G06T 12/30G01N 23/20G01N 23/2206G01N 23/223G06T 7/13G06T 7/155G06V 10/764+10 more
AI classification
Vision1.00
AI hardware0.59
Machine learning0.03
Natural language0.00
Evolutionary computation0.00
Speech0.00
Knowledge representation0.00
Planning0.00
Ownership
CARL ZEISS X-RAY MICROSCOPY, INC.
assignment · 620490479
Assignors
ANDREW, MATTHEW, OMLOR, LARS, BALE, HRISHIKESH, HAGEN, CHRISTOPH GRAF VOM
On an employer assignment, the assignors are typically the inventors.
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