METHOD AND SYSTEM FOR DETECTING MACHINE DEFECTS

Patent №

US 11,746,752

Granted

2023-09-05

Filed 2021

Owner

AKTIEBOLAGET SKF

Lab

AI components

3

ml · planning · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

17380106

A method for detecting at least one machine defect provides defining from the machine kinematic data at least one condition indicator reflecting its condition, recording operating condition data of the machine and condition monitoring data of the machine during a predetermined period when the machine is operating normally, determining condition indicator values using condition monitoring data, and for determining current condition indicator values from the at least one condition indicator and the current condition monitoring data, a machine learning algorithm, predicting condition indicator values with respect to the current operating condition data, training the machine learning algorithm to establish a relation between the operating condition data and condition indicator values, and comparing the current condition indicator values and the predicted condition indicator values, and for determining if the machine is presumed to operate normally or not according to the result of the comparison.

Machine learningPlanningAI hardwareF03D 17/00F03D 80/50G01M 13/045G01M 99/005G05B 23/00G06N 3/02G06N 20/00F05B 2260/80+3 more

AI classification

Machine learning1.00
AI hardware0.99
Planning0.89
Vision0.38
Knowledge representation0.07
Natural language0.00
Speech0.00
Evolutionary computation0.00

Ownership

AKTIEBOLAGET SKF

assignment · 616180691

Assignors

STRÖMBERGSSON, STIG ERIK DANIEL

On an employer assignment, the assignors are typically the inventors.

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