METHOD AND APPARATUS FOR TRAINING CELL DEFECT DETECTION MODEL

Patent №

US 11,763,549

Granted

2023-09-19

Filed 2023

Owner

CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED

Lab

AI components

4

ml · vision · planning · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

18308374

A method for training a cell defect detection model includes training a defect classification model that includes an output layer using a plurality of first sample images so that a defect classification model obtained through training is capable of predicting a plurality of first-preset-category defects of a cell, inputting a second sample image to a defect classification model with at least an output layer removed to obtain a sample feature vector of the second sample image, inputting the sample feature vector of the second sample image to a backbone model to obtain a predicted defect classification result of the second sample image, and adjusting, based on a second-preset-category defect and the predicted defect classification result of the second sample image, parameters of the backbone model and the defect classification model with at least the output layer removed.

Machine learningVisionPlanningAI hardwareG06V 10/774G06N 3/045G06N 3/096G06T 7/0004G06V 10/44G06V 10/761G06V 10/764G06T 2207/20081+2 more

AI classification

Vision1.00
Machine learning1.00
AI hardware1.00
Planning0.99
Knowledge representation0.24
Natural language0.03
Evolutionary computation0.00
Speech0.00

Ownership

CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED

assignment · 634670184

Assignors

SHU, ANNAN, JIANG, GUANNAN, WANG, ZHIYU

On an employer assignment, the assignors are typically the inventors.

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