Patent №
US 11,763,549
Granted
2023-09-19
Filed 2023
Owner
CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
Lab
—
AI components
4
ml · vision · planning · hardware
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
18308374
A method for training a cell defect detection model includes training a defect classification model that includes an output layer using a plurality of first sample images so that a defect classification model obtained through training is capable of predicting a plurality of first-preset-category defects of a cell, inputting a second sample image to a defect classification model with at least an output layer removed to obtain a sample feature vector of the second sample image, inputting the sample feature vector of the second sample image to a backbone model to obtain a predicted defect classification result of the second sample image, and adjusting, based on a second-preset-category defect and the predicted defect classification result of the second sample image, parameters of the backbone model and the defect classification model with at least the output layer removed.
AI classification
Ownership
CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
assignment · 634670184
Assignors
SHU, ANNAN, JIANG, GUANNAN, WANG, ZHIYU
On an employer assignment, the assignors are typically the inventors.