PARAMETER CALIBRATION METHOD, PARAMETER CALIBRATION SYSTEM AND NON-TRANSITORY COMPUTER READABLE MEDIUM

Patent №

US 12,667,969

Granted

2026-06-30

Filed 2023

Owner

INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

Lab

AI components

0

Assignment

None on record

Dataset

AIPD

Application

18540409

A parameter calibration method includes: establishing a kinematic model function of the multi-link device, the kinematic model function comprising a parameter set; controlling the multi-link device to acquire N measurement points located on a first and a second planes of an object with a measurement tool, and recording N parameter sets as N initial parameter sets when the multi-link device acquires the N measurement points with the measurement tool, wherein the first and the second planes are parallel to each other and have a predetermined dimension; establishing a plurality of target functions associated with the N measurement points based on the N parameter sets and the kinematic model function; updating the N parameter sets based on the target functions to obtain N updated parameter sets; obtaining a parameter modification of the parameter set based on the N initial parameter sets and the N updated parameter sets.

B25J 9/1692

Ownership

INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

From the same owner

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