PARAMETER CALIBRATION METHOD, PARAMETER CALIBRATION SYSTEM AND NON-TRANSITORY COMPUTER READABLE MEDIUM
Patent №
US 12,667,969
Granted
2026-06-30
Filed 2023
Owner
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Lab
—
AI components
0
Assignment
None on record
Dataset
AIPD
Application
18540409
A parameter calibration method includes: establishing a kinematic model function of the multi-link device, the kinematic model function comprising a parameter set; controlling the multi-link device to acquire N measurement points located on a first and a second planes of an object with a measurement tool, and recording N parameter sets as N initial parameter sets when the multi-link device acquires the N measurement points with the measurement tool, wherein the first and the second planes are parallel to each other and have a predetermined dimension; establishing a plurality of target functions associated with the N measurement points based on the N parameter sets and the kinematic model function; updating the N parameter sets based on the target functions to obtain N updated parameter sets; obtaining a parameter modification of the parameter set based on the N initial parameter sets and the N updated parameter sets.
Ownership
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE