Patent US 3,936,665

A sheet material characteristic monitoring apparatus is provided for use in processes involving the production and contouring of sheet material. In a preferred embodiment, the sheet material characteristic is measured at two or more stationary cross direction locations of the sheet. A digital computer computes a regression equation between the measured values of the sheet characteristic and their respective locations, which equation is evaluated between limits representing the sheet edges to provide a data profile comprising estimated values of the sheet characteristic across the width of the sheet. The data profile may be derived substantially instantaneously. The data profile may further be evaluated between limits representing one or more desired transverse dimensions of the sheet.