DEFECT DETECTING METHOD AND APPARATUS

Patent №

US 4,492,476

Granted

1985-01-08

Filed 1982

Owner

KIRIN BEER KABUSHIKI KAISHA

Lab

AI components

2

vision · evo

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

06347745

In a defect detecting method and apparatus, the image of a bottle under inspection, which is conveyed while being spun, is divided into picture elements arranged in a matrix form, signals representative of the picture elements are generated sequentially and repeatedly, and the signals of the picture elements, on the same imaginary line perpendicular to the central axis of the image, are compared with each other, and the result of the comparison is used to detect a defect such as a foreign matter or a scratch.

AI classification

Vision0.84
Evolutionary computation0.52
Planning0.18
Natural language0.01
Machine learning0.00
AI hardware0.00
Speech0.00
Knowledge representation0.00

Ownership

KIRIN BEER KABUSHIKI KAISHA

assignment · 39770014

Assignors

MIYAZAWA, TAKASHI

On an employer assignment, the assignors are typically the inventors.

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