SYSTEM AND METHOD FOR PATTERN RECOGNITION

A system and method are disclosed for optically reading out one or more discrete line patterns from a pattern-carrying medium under a range of different conditions. The patterns may constitute alphanumeric characters arranged in serial alignment on the medium or a variety of other types of line patterns, or a single line pattern. In accordance with the present invention, the disclosed system is capable of successively reading out the patterns with a high degree of reliability, notwithstanding variations in their size, orientation and location, or variations in the color and reflectivity of the pattern-carrying medium surface. Further, the disclosed system and method are tolerant of the presence of blotches, scratches and other surface marks, and of irregularities in the otherwise uniform planar or curved surface of the medium. The invention is applicable to the readout of patterns that are printed on the surface, stamped or otherwise impressed onto it, or raised above it by embossing or the like.