ELECTRICALLY ALTERABLE NON-VOLATILE MEMORY

A non-volatile memory and method is described incorporating an array of variable threshold transistors, a row decoder, a buffer circuit positioned between the array and row decode circuitry, column decode circuitry, and a sense amplifier. The non-volatile memory overcomes the problem of high voltages in the memory array during READ operation. During READ operation the variable threshold transistors operate in the common source mode. A buffer circuit with level shift capability is described incorporating P and N channel transistors. A sense amplifier with decoupling during sensing or lock out is described incorporating P and N channel transistors.