PATTERN CHECK DEVICE

Patent №

US 4,607,387

Granted

1986-08-19

Filed 1983

Owner

FUJI ELECTRIC COMPANY, LTD., 1-1, TANABESHINDEN, KAWASAKI-KU, KAWASAKI-SHI, KANAGAWA, JAPAN A CORP. OF JAPAN

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

06462879

A pattern checking device receives scanning data obtained by raster scanning objects within predefined window regions with a photoelectric converter, converts the scanned data into pixel binary data, and evaluates the binary data in accordance with predetermined criteria to produce an output signal indicative of the evaluation. The evaluation is performed in at least two steps. In the first step, a primary decision circuit compares individual data from each window region in a group to upper and lower thresholds, and outputs primary decision result signals for each window region. In the second step, a secondary decision circuit compares all the primary decision result signals for all the window regions in the group with previously stored decision data for the group, and outputs a pattern check signal indicating whether the pattern appearing in the group of window regions constitutes a good pattern.

AI classification

Vision1.00
Knowledge representation0.01
Planning0.01
AI hardware0.00
Machine learning0.00
Natural language0.00
Speech0.00
Evolutionary computation0.00

Ownership

FUJI ELECTRIC COMPANY, LTD., 1-1, TANABESHINDEN, KAWASAKI-KU, KAWASAKI-SHI, KANAGAWA, JAPAN A CORP. OF JAPAN

assignment · 41360403

Assignors

MIYAGAWA, MICHIAKI

On an employer assignment, the assignors are typically the inventors.

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