NONDESTRUCTIVE NONCONTACT DEVICE TO CHARACTERIZE SEMICONDUCTOR MATERIAL

Patent №

US 4,637,726

Granted

1987-01-20

Filed 1985

Owner

UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF THE ARMY

Lab

AI components

1

hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

06699282

A wafer is positioned in a magnetic field. A computer initializes the light level and the electronic gain of each detector preamp associated with a fiber optic link from the analyzer. The magnetic field direction would then be reversed by computer command. This would cause a localized change in intensity of light passing through the wafer, due to Faraday Rotation (FR). The resulting change in detector output together with location and wavelength data could be used to compute a map of the wafer.

AI hardwareG01N 21/21G01N 2021/218G01N 2021/8461G01N 2021/8645G01N 2201/08

AI classification

AI hardware0.59
Natural language0.00
Knowledge representation0.00
Evolutionary computation0.00
Vision0.00
Machine learning0.00
Planning0.00
Speech0.00

Ownership

UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF THE ARMY

assignment · 46150058

Assignors

WALKER, CLIFFORD G., TANTON, GEORGE A.

On an employer assignment, the assignors are typically the inventors.

© 2026 NYSGPT2525 LLC