PATTERN POSITION DETECTING APPARATUS

Patent №

US 4,644,584

Granted

1987-02-17

Filed 1983

Owner

TOKYO SHIBAURA DENKI KABUSHIKI KAISHA, 72 HORIKAWA-CHO, SAIWAI-KU, KAWASAKI-SHI, JAPAN A CORP. OF

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

06495128

A pattern position detecting apparatus has an ITV camera for receiving the image of a pattern of the IC chip and a memory for storing therein the image signal from the ITV camera as a pattern data. When the pattern data is read out from the memory, a pattern section is shifted every second picture-element array in the horizontal and vertical directions and the picture elements are picked up every second picture element from the pattern section. The pattern data corresponding to the pattern sections read out from the memory are compared with reference pattern data, whereby determination is made of the degree of coincidence between both of the patterns. After determination has been made of the degrees of coincidence with respect to the whole pattern, detection is made of the position of the pattern section having the highest degree of coincidence among said degrees of coincidence in accordance with the address of the memory.

VisionG06V 10/7515G06V 10/75

AI classification

Vision1.00
Natural language0.01
Machine learning0.00
Knowledge representation0.00
Planning0.00
AI hardware0.00
Evolutionary computation0.00
Speech0.00

Ownership

TOKYO SHIBAURA DENKI KABUSHIKI KAISHA, 72 HORIKAWA-CHO, SAIWAI-KU, KAWASAKI-SHI, JAPAN A CORP. OF

assignment · 41990269

Assignors

NAGASHIMA, SUMIO, SUZUKI, ETSUJI, CHIYODA, KIYOMU, KODAMA, MASAHIRO

On an employer assignment, the assignors are typically the inventors.

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