Patent №
US 4,657,394
Granted
1987-04-14
Filed 1985
Owner
NEW YORK INSTITUTE OF TECHNOLOGY, A CORP OF NEW YORK
Lab
—
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
06753722
Phase measurements of deformed grating images are used in performing improved optical profilometry. Individual line profiles are obtained at a series of rotational increments of a body. A full 360 degree surface profile, or a portion thereof, can then be generated.
AI classification
Ownership
NEW YORK INSTITUTE OF TECHNOLOGY, A CORP OF NEW YORK
assignment · 44330484
Assignors
HALIOUA, MAURICE
On an employer assignment, the assignors are typically the inventors.