Patent №
US 4,755,752
Granted
1988-07-05
Filed 1986
Owner
SIGMA RESEARCH, INC., A CORP. OF WASHINGTON
+4 more
Lab
—
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
06886217
A method for the direct visualization of surface and near surface cracks, voids, flaws, discontinuities, etc. in a material is disclosed. The detection of flaws or the like is accomplished by the visualization of the static and/or dynamic magnetic fields, either ambient or induced, associated with various flaws in a target material. A magnetic garnet epitaxial film is deposited on either side of a non-magnetic substrate. In one embodiment, a reflective coating or material is provided adjacent to the epitaxial film, and the substrate with its associated layers is placed over the target material. A magnetic field is then applied to the target material and substrate. Polarized light is transmitted onto the target material and is reflected through the epitaxial layer and back out of the substrate. The existing magnetization within the epitaxial film interacts with nearby magnetic fields associated with near surface flaws in the target material, such that the domain structure of the epitaxial film is altered. The altered domain structure induces a rotation of the plane of polarization of the incident projected light. When viewed through a polarizing material disposed on the top epitaxial layer, the rotation of the reflected light renders the magnetic field variations associated with the flaws directly visible. Accordingly, surface and near surface flaws are optically detected.
AI classification
Ownership
SIGMA RESEARCH, INC., A CORP. OF WASHINGTON
assignment · 46420595
FITZPATRICK, GERALD L.
assignment · 48420820
PHYSICAL RESEARCH, INC.
assignment · 54160482
PRI INSTRUMENTATION, INC., A CA CORP.
assignment · 55560523
FITZPATRICK, GERALD
assignment · 55590305
Assignors
FITZPATRICK, GERALD L.
On an employer assignment, the assignors are typically the inventors.