METHOD AND APPARATUS FOR IMPROVED MONITORING AND DETECTION OF IMPROPER DEVICE OPERATION

Patent №

US 4,773,028

Granted

1988-09-20

Filed 1984

Owner

TEKTRONIX, INC., A CORP. OF DE

Lab

AI components

2

ml · planning

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

06656819

A method and apparatus is disclosed for the improved monitoring and detection of improper device operation. Operation of a prototype device is first modeled. In particular, a set of test vectors is selected to provide a desired degree of testing of the prototype unit. The expected response of the prototype to the selected set of test vectors is determined through the use of analytical prediction means, and stored for subsequent comparison with the operation of the prototype unit. Thereafter, the selected set of test vectors are applied to the prototype unit, and the response thereto compared in real time with the expected responses. Improper operation of the prototype device is thereby identified, and associate information recorded for subsequent analysis.

Machine learningPlanningG01R 31/31935G01R 31/3193G06F 11/3466G06F 11/261

AI classification

Planning0.99
Machine learning0.65
AI hardware0.39
Knowledge representation0.07
Natural language0.00
Vision0.00
Evolutionary computation0.00
Speech0.00

Ownership

TEKTRONIX, INC., A CORP. OF DE

assignment · 48960722

Assignors

TALLMAN, JAMES L.

On an employer assignment, the assignors are typically the inventors.

© 2026 NYSGPT2525 LLC