METHOD AND APPARATUS FOR IMPROVED MONITORING AND DETECTION OF IMPROPER DEVICE OPERATION
Patent №
US 4,773,028
Granted
1988-09-20
Filed 1984
Owner
TEKTRONIX, INC., A CORP. OF DE
Lab
—
AI components
2
ml · planning
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
06656819
A method and apparatus is disclosed for the improved monitoring and detection of improper device operation. Operation of a prototype device is first modeled. In particular, a set of test vectors is selected to provide a desired degree of testing of the prototype unit. The expected response of the prototype to the selected set of test vectors is determined through the use of analytical prediction means, and stored for subsequent comparison with the operation of the prototype unit. Thereafter, the selected set of test vectors are applied to the prototype unit, and the response thereto compared in real time with the expected responses. Improper operation of the prototype device is thereby identified, and associate information recorded for subsequent analysis.
AI classification
Ownership
TEKTRONIX, INC., A CORP. OF DE
assignment · 48960722
Assignors
TALLMAN, JAMES L.
On an employer assignment, the assignors are typically the inventors.