Patent №
US 4,846,576
Granted
1989-07-11
Filed 1986
Owner
FUJITSU LIMITED
Lab
—
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
06864846
A method for measuring a three-dimensional position of an object with a single camera and a multislit light, i.e., a source of multiplanar light beams. A surface of the object is irradiated with multislit lights, i.e., multiplanar light beams, having a plurality of slit light faces and also irradiated with a single standard slit light having a slit light face identical to one of the plurality of slit light faces of the multislit lights. A plurality of slit light photo images corresponding to a plurality of slit light projected images and a standard slit light photo image corresponding to a slit light projected image formed on the object are obtained. One of the slit light photo images which corresponds to the standard slit light photo image is specified and made to correspond, to compute a three-dimensional position of the object in a predetermined coordinate.
AI classification
Ownership
FUJITSU LIMITED
assignment · 45560875
Assignors
MARUYAMA, TSUGITO, KANDA, SHINJI, HANAHARA, KEISHI
On an employer assignment, the assignors are typically the inventors.