TWO-DIMENSIONAL COMPTON PROFILE IMAGING METHOD

Patent №

US 4,850,002

Granted

1989-07-18

Filed 1987

Owner

U.S. PHILIPS CORPORATION, A CORP. OF DE

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

07092805

The invention relates to a method of determining the Compton profile of an object to be examined which is situated in an examination zone. The examination zone is irradiated by a monochromatic primary beam whose energy is chosen so that the attenuation of the primary radiation is due essentially only to the Compton Scattering. The scattered radiation is measured in an energy resolving manner and therefrom, as well as from the attenuation in the primary beam, the Compton profiles for the individual pixels in the examination zone are determined.

VisionA61B 6/483G01N 23/20066

AI classification

Vision0.86
AI hardware0.00
Machine learning0.00
Natural language0.00
Planning0.00
Evolutionary computation0.00
Knowledge representation0.00
Speech0.00

Ownership

U.S. PHILIPS CORPORATION, A CORP. OF DE

assignment · 48210872

Assignors

HARDING, GEOFFREY, KOSANETZKY, JOSEF-MARIA, NEITZEL, ULRICH

On an employer assignment, the assignors are typically the inventors.

From the same owner

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