APPARATUS FOR INSPECTING THE MOLDED CASE OF AN IC DEVICE

An inspection apparatus includes a device which prepares a circumscribing line of an object to be inspected from pictured image information of the inspected object, and a device which judges the quality of the inspected object from the image information on a portion of the inspected object defined by the circumscribing line prepared by the circumscribing line preparation device. The inspection apparatus may include a device which detects an inclination angle of a nondefective article with respect to a predetermined reference line from pictured image information of the nondefective article, said nondefective article serving as a reference which has the same configuration as the inspected object and registers the inclination angle as a reference angle, and a device for inspecting the quality of the inspected object based on the reference angle in the reference angle detecting and registering device. Moreover, the inspection apparatus may include a device which memorizes pictured image information of the object to be inspected by quantizing it, a device which rotates the quantized image information of the inspected object that is memorized in the quantization and memory device, and a device which memorizes the quantized image information rotated by the image information rotation device after making it multi-valued.