METHOD AND APPARATUS FOR MEASURING TRANSVERSE THICKNESS PROFILE OF A METAL STRIP

Patent №

US 5,202,909

Granted

1993-04-13

Filed 1991

Owner

INSTITUT DE RECHERCHES DE LA SIDERURGIE FRANCAISE (IRSID), A FRENCH BODY CORP.

+1 more

Lab

AI components

1

planning

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

07752057

The invention has an X-ray emitting tube and a linear detector on opposite sides of a plane containing a strip to be measured and an electronic acquisition, measuring and control unit. A mask transversely moveable relative to the strip occludes radiation from the X-ray emitting tube which is not intercepted by the strip or which passes through the edge region of the strip. This device offers an improved degree of precision measurement near the edge of the strip.

PlanningG01B 15/025G01B 15/045

AI classification

Planning0.61
Vision0.00
Machine learning0.00
AI hardware0.00
Natural language0.00
Speech0.00
Evolutionary computation0.00
Knowledge representation0.00

Ownership

INSTITUT DE RECHERCHES DE LA SIDERURGIE FRANCAISE (IRSID), A FRENCH BODY CORP.

assignment · 58400165

SOLLAC

assignment · 64720476

Assignors

GAUJE, PIERRE

On an employer assignment, the assignors are typically the inventors.

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