BIDIRECTIONAL BOUNDARY-SCAN CIRCUIT

A boundary-scan circuit for a bidirectional pin of an integrated circuit which uses fewer standard cells if a cell design is considered, or fewer devices if non-standard cell integrated circuits are considered. In either case, the present invention provides the same functionality as provided in of the bidirectional boundary-scan circuits shown in TEEE 1149.1 in a circuit that should be more compact for the same logic family and integration technology.