FOREIGN MATTER DETECTION DEVICE

Patent №

US 5,331,396

Granted

1994-07-19

Filed 1992

Owner

MATSUSHITA ELECTRIC INDUSTRIAL CO. LTD.

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

07958572

A foreign matter detection device, for detecting a foreign matter on a photomask of transparent material with opaque patterns formed thereon, includes a laser source for emitting an S-polarized laser beam so as to impinge on a first surface of the photomask which reflects a P-polarized laser beam. A light source is provided to illuminate the photomask at an opposed surface to the first surface, from which a light transmits. This reflected P-polarized laser beam and transmitted light enters, through a condenser lens and a deflection plate, into a CCD in which an image representing the condition of the impinged surface is obtained. Since the P-polarized laser beam indicative of the corner edge of the pattern is offset by the transmitted light passing around the same corner edge, the pattern image is obscured and foreign matter is distinguishable in the obtained image.

VisionG01N 21/94G01N 21/21G01N 2021/8887G01N 2201/102

AI classification

Vision0.82
Natural language0.00
Speech0.00
Evolutionary computation0.00
Knowledge representation0.00
AI hardware0.00
Machine learning0.00
Planning0.00

Ownership

MATSUSHITA ELECTRIC INDUSTRIAL CO. LTD.

assignment · 63000822

Assignors

YUKAWA, NORIAKI, UEDA, HIDESHI, OHGAWARA, DAISUKE

On an employer assignment, the assignors are typically the inventors.

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