Patent №
US 5,630,019
Granted
1997-05-13
Filed 1995
Owner
KABUSHIKI KAISHA TOPCON
Lab
—
AI components
3
ml · vision · hardware
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
08454407
Disclosed is a waveform evaluating apparatus for evaluating and adjusting a waveform measured by a measurement apparatus such as a synchroscope and, more particularly, a waveform evaluating apparatus having a plurality of neural network modules formed independently for each object of judgment, in which the neural weight ratio of each neural network module is determined by causing the module to learn with a first ideal waveform module as an ideal signal and the like. Such an arrangement is also made, in which a signal in phase with the learned teacher signal extracted from the signal from an object of judgment signal is input to the input layer, and in which phasic information is detected in a phase detecting portion and a waveform is sliced in a waveform slicing portion on the basis of the phasic information. Further, such an arrangement is made, in which signal waveform data as an object of evaluation is input to the input layer and an analog output is output from the output layer. Therefore, waveform adjustments can also be achieved by causing the module to learn with a waveform to be adjusted.
AI classification
Ownership
KABUSHIKI KAISHA TOPCON
assignment · 83910267
Assignors
KOCHI, NOBUO
On an employer assignment, the assignors are typically the inventors.