IDENTIFICATION OF FAULTS IN DATA PATHS AND FUNCTIONAL UNITS OF A CENTRAL PROCESSING UNIT BY SYSTEMATIC EXECUTION OF TEST INSTRUCTIONS

Patent №

US 5,712,972

Granted

1998-01-27

Filed 1995

Owner

SONY ELECTRONICS, INC.

+1 more

Lab

AI components

2

kr · planning

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

08483604

A systematically structured diagnostic for detecting, isolating, analyzing and reporting problems or faults in a central processing unit. The diagnostic causes the central processing unit to execute instructions, the instructions being selected such that the central processing unit, in executing the instructions, must use every data path and functional unit therein. Errors caused by particular instructions are correlated with the functional units or datapaths used by those instructions, to produce a list of possibly faulty datapaths and functional units. Test procedures, specifically designed to the possibly faulty datapaths and functional units, are then applied to the central processing unit to isolate which of the possibly faulty data paths or functional units are in fact faulty, which are then reported. The instructions, test procedures and other information used by the diagnostic are stored in databases, so that the diagnostic has a modular and data-driven structure which permits evolution of the diagnostic over time as the central processing unit layout changes and the diagnostic is upgraded to provide higher levels of fault-detection functionality.

AI classification

Planning0.99
Knowledge representation0.69
AI hardware0.37
Natural language0.00
Vision0.00
Evolutionary computation0.00
Machine learning0.00
Speech0.00

Ownership

SONY ELECTRONICS, INC.

assignment · 76270172

SONY CORPORATION

assignment · 84260836

Assignors

KAKKAR, SUNIL

On an employer assignment, the assignors are typically the inventors.

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