METHOD AND SYSTEM FOR INSPECTING INTEGRATED CIRCUIT LEAD BURRS

Patent №

US 5,745,593

Granted

1998-04-28

Filed 1996

Owner

SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS, INC.

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

08686296

Burr inspection system (120) inspects an electrical lead for a burr (112) in association with the operation of a machine vision lead inspection system (10) and includes machine vision circuitry (50) for forming an image (70) of the electrical lead (72) using machine vision lead inspection system (10). Edge detecting instructions (120) associate with machine vision circuitry (50) for determining a plurality of edges (89, 91) associated with the electrical lead (72). Scan line determining instructions (128) calculate a plurality of scan lines (88, 90) each corresponding to the contour of a selected one of the plurality of edges (89, 91). The scan lines (88, 90) are separated from edges (88, 90) and image (70) by a preselected distance (92). Inspecting circuitry (130) inspects each scan line (88, 90) to detect whether a burr image (112) crosses the scan line (88, 90) to determine the presence of a burr on the electrical lead.

VisionG06T 7/0006G01R 31/311G06T 2207/30148

AI classification

Vision1.00
Knowledge representation0.01
Evolutionary computation0.00
Natural language0.00
Planning0.00
AI hardware0.00
Speech0.00
Machine learning0.00

Ownership

SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS, INC.

assignment · 86830225

© 2026 NYSGPT2525 LLC