Patent US 5,748,769

A pattern recognition apparatus includes a pattern analyzer for analyzing a similarity between an input pattern and a learning pattern, a hypothetic pattern forming section for forming, as a hypothetic pattern, a predetermined pattern corresponding to the input pattern in accordance with an analysis result from the pattern analyzer, a comparator for comparing the hypothetic pattern formed by the hypothetic pattern forming section with the input pattern, an attribute descriptor in which a comparison result obtained by the comparator and the analysis result obtained by the pattern analyzer are described, and an inference section for, referring to a description described in the attribute descriptor, outputting a clear analysis result obtained from the pattern analyzer as a final recognition result, and starting the hypothetic pattern forming section in response to an ambiguous analysis result by the pattern analyzer.