PATTERN RECOGNITION BY UNSUPERVISED METRIC LEARNING

Patent №

US 5,774,576

Granted

1998-06-30

Filed 1995

Owner

NEC RESEARCH INSTITUTE, INC.

Lab

AI components

4

ml · nlp · vision · kr

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

08503051

A pattern recognition method uses unsupervised metric learning starting from a mixture of normal densities which explains well observed data. An improved decision rule is provided for selecting the reference database element most likely to correspond to a query.

AI classification

Machine learning1.00
Vision1.00
Natural language0.99
Knowledge representation0.75
AI hardware0.06
Speech0.05
Planning0.00
Evolutionary computation0.00

Ownership

NEC RESEARCH INSTITUTE, INC.

assignment · 77380868

Assignors

COX, INGEMAR J., YIANILOS, PETER N.

On an employer assignment, the assignors are typically the inventors.

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