METHOD AND APPARATUS FOR OPTICAL INTERFEROMETRIC MEASUREMENTS WITH REDUCED SENSITIVITY TO VIBRATION
Patent №
US 5,777,741
Granted
1998-07-07
Filed 1996
Owner
ZYGO CORPORATION
Lab
—
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
08770741
A method and system for providing interferometric measurements having reduced sensitivity to vibrations. An interference pattern from an interferometer (35) is amplitude split into first and second interferograms and imaged onto first and second detectors (10, 11), respectively, such as CCD cameras (10, 11). The two cameras (10, 11) have different data acquisition rates. The frame integration period of the slow detector is distinctly shorter than that of the fast detector. The detectors (10,11) are disposed such that the image fields substantially overlap and are synchronized with each other for enhancing vibration insensitivity. The shorter the integration period of the slow detector with respect to the fast detector, the greater the vibration insensitivity. During data acquisition a phase shifter (45) changes the phase difference between the beams in the interferometer (35) while data from both cameras (10, 11) is taken by a frame grabber (15) and saved in a computer (25). During data analysis, the phase at each image point on each frame of the fast data set is calculated by the computer (25), with the phase difference between interferograms in the slow data set being determined from the phases derived from the fast data set and with the slow data set then being analyzed for phase at each image point using the measured phase increments.
AI classification
Ownership
ZYGO CORPORATION
assignment · 86730976
Assignors
DECK, LESLIE L.
On an employer assignment, the assignors are typically the inventors.