INDIVIDUAL TEST PROGRAM PRODUCING SYSTEM

A test program producing device including a test item information producing unit for reading circuit information, macro to be tested information and a library to produce necessary information regarding test items for an LSI to be examined, a test possibility/impossibility determining unit for calculating a total capacity of an object of a test pattern in a test program to be produced and comparing the total capacity of the object with a memory capacity of a testing device which executes a test for the LSI to be examined to determine whether a test is possible or not based on comparison results, and an individual test program producing unit for embedding information regarding test items in a model of a test program when determination is made that a test is possible, to produce a test program for use in an individual test of the LSI to be examined.