METHOD AND APPARATUS FOR TRACKING POWER OF AN INTEGRATED CIRCUIT

An integrated circuit which includes a temperature modeling circuit for reducing operational activity of the integrated circuit when its operating temperature exceeds a predefined threshold. The temperature modeling circuit includes several multiplexers each of which corresponds to a particular sub-circuit within the integrated circuit. The multiplexers select one of at least two heat generation values inputted thereto in accordance with the operating mode of the corresponding sub-circuit. A multi-input adder adds the selected heat generation values along with values representing the rate at which heat is being dissipated by the integrated circuit, the rate at which heat is being generated by background operations of the integrated circuit, and a previous temperature of the integrated circuit. The added values relate to the current operating temperature of the integrated circuit which is compared to a predefined temperature using a comparator. When the current operating temperature of the integrated circuit exceeds the predefined value, the comparator dispatches a command instructing the integrated circuit to halt or slow its operational activity and thereby reduce its current temperature.