METHOD OF AND APPARATUS FOR MEASURING SHAPE

Patent №

US 5,960,379

Granted

1999-09-28

Filed 1997

Owner

FUJI XEROX CO., LTD.

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

08975647

A shape measuring apparatus includes a partial surface measuring device for dividing a surface to be measured having a three-dimensional shape into a plurality of partial regions having mutually overlapped regions and measuring surface shapes of the plurality of partial regions. Movement mechanisms for respectively determining positional attitudes of the partial regions and the partial surface measuring device are also includes, along with a measurement controller for roughly joining measured data on the surface shapes of the partial regions to one another, based on the positional attitudes. Thereafter, fitting of the measured data on the surface shape of the other partial region to the measured data on the surface shape of one partial region in the overlapped regions is performed only in the direction of the substantial normal to the surface of each overlapped region so as to join adjacent the partial regions to one another. The shape measuring apparatus, and corresponding method of use, measures the entire three-dimensional shape of the surface to be measured.

VisionG01B 11/255G01B 9/02085G01B 11/2441G01M 11/025G01M 11/0271

AI classification

Vision0.86
Natural language0.00
Machine learning0.00
Evolutionary computation0.00
Knowledge representation0.00
Speech0.00
AI hardware0.00
Planning0.00

Ownership

FUJI XEROX CO., LTD.

assignment · 88470267

Assignors

SHIMIZU, KEISHI, YAMADA, HIDENORI, UEYANAGI, KIICHI

On an employer assignment, the assignors are typically the inventors.

From the same owner

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