METHOD FOR COMPUTER-AIDED MEASUREMENT AND TESTING OF ELECTRICAL CIRCUITS, IN PARTICULAR OF ELECTRONIC ASSEMBLIES, AND A TEST RIG FOR CARRYING OUT THE METHOD
Patent №
US 5,963,889
Granted
1999-10-05
Filed 1997
Owner
SIEMENS AKTIENGESELLSCHAFT
Lab
—
AI components
1
hardware
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
08952890
A method for computer-aided measurement and testing of electrical circuits, and a test rig for carrying out such method, wherein the measurement and control tasks carried out by computer-aided measurement and test equipment during a test process, controlled by test software, for electrical circuits, are split into a data-relevant element, which contains test specification data and test instruction data, and a control-relevant test equipment driver section. The data-relevant element is formed in a text data field (TD) from which the control-relevant information can then be picked off. The invention can be used in all computer-controlled measurement and test rigs with measurement and control tasks as modular product-neutral test software.
AI classification
Ownership
SIEMENS AKTIENGESELLSCHAFT
assignment · 89630833
Assignors
IRREGGER, FRANZ, MEISSNER, HORST, STEPHAN, HARALD
On an employer assignment, the assignors are typically the inventors.