METHOD FOR COMPUTER-AIDED MEASUREMENT AND TESTING OF ELECTRICAL CIRCUITS, IN PARTICULAR OF ELECTRONIC ASSEMBLIES, AND A TEST RIG FOR CARRYING OUT THE METHOD

Patent №

US 5,963,889

Granted

1999-10-05

Filed 1997

Owner

SIEMENS AKTIENGESELLSCHAFT

Lab

AI components

1

hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

08952890

A method for computer-aided measurement and testing of electrical circuits, and a test rig for carrying out such method, wherein the measurement and control tasks carried out by computer-aided measurement and test equipment during a test process, controlled by test software, for electrical circuits, are split into a data-relevant element, which contains test specification data and test instruction data, and a control-relevant test equipment driver section. The data-relevant element is formed in a text data field (TD) from which the control-relevant information can then be picked off. The invention can be used in all computer-controlled measurement and test rigs with measurement and control tasks as modular product-neutral test software.

AI hardwareG01R 31/2834G01R 31/31912

AI classification

AI hardware0.58
Planning0.00
Vision0.00
Natural language0.00
Knowledge representation0.00
Speech0.00
Machine learning0.00
Evolutionary computation0.00

Ownership

SIEMENS AKTIENGESELLSCHAFT

assignment · 89630833

Assignors

IRREGGER, FRANZ, MEISSNER, HORST, STEPHAN, HARALD

On an employer assignment, the assignors are typically the inventors.

From the same owner

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