Patent US 6,028,547

To explore and analyze the structure of an object (O), the method according to the invention comprises transmission of at least one incident wave into said structure, reception of the waves retransmitted by the structure, by a plurality of independent detection elements (D1, Dn); memorization after digitization of the data supplied by the detection elements, in a field memory (MC); in respect of each point (Pij) of the object (O), computation of the positions occupied, in the field memory by the signals detected by the detection elements (D1, Dn) corresponding to the waves coming from said point (Pij); then reading of the field memory and addition of all the values contained in the memory positions corresponding to each point (Pij), the value (Vp) representative of the importance of the wave coming from said point (Pij) being obtained by multiplying the result of the addition by a correction factor (K).