METHOD AND SYSTEM FOR DESIGN VERIFICATION

Patent №

US 6,178,533

Granted

2001-01-23

Filed 1997

Owner

SUN MICROSYSTEMS, INC.

Lab

AI components

2

ml · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

08885160

The present invention pertains to a dynamic process for generating biased pseudo-random test patterns for the functional verification of a microprocessor having a bus interface unit that is capable of direct memory access (DMA) operations between I/O devices attached to an external bus and the microprocessor's memory. The test patterns verify memory operations performed by the microprocessor and DMA operations received by the microprocessor's bus interface unit. These test patterns can then be used by a simulation mechanism to simulate the expected results of the target microprocessor running the generated sequence of transactions. The test verification system categorizes the verifiable operations into transactions. Each transaction is assigned a user-defined weight that is used to bias the frequency that a transaction is tested. The test verification system selects a particular transaction category based on the user-defined weights and generates the corresponding instructions or test patterns that implement the transaction.

AI classification

AI hardware0.99
Machine learning0.84
Vision0.18
Evolutionary computation0.16
Planning0.02
Natural language0.00
Knowledge representation0.00
Speech0.00

Ownership

SUN MICROSYSTEMS, INC.

assignment · 86630431

Assignors

CHANG, LAWRENCE L.

On an employer assignment, the assignors are typically the inventors.

© 2026 NYSGPT2525 LLC