THREE-DIMENSIONAL MEASUREMENT APPARATUS

Patent №

US 6,233,049

Granted

2001-05-15

Filed 1999

Owner

MINOLTA CO., LTD.

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

09273544

A three-dimensional measurement device employs a slit ray projection technique to optically determine a three-dimensional image. The device offers a choice in operating modes between high-speed measurement, high-resolution measurement and large dynamic range in the depth direction, to accommodate various situations. The different modes of operation are achieved by selectively modifying one or more of the scanning speed of a projected reference beam, the readout speed of a photosensor, the line width or line spacing of the photosensor, and the number of lines per image frame.

AI classification

Vision1.00
Natural language0.01
Speech0.00
Knowledge representation0.00
AI hardware0.00
Machine learning0.00
Evolutionary computation0.00
Planning0.00

Ownership

MINOLTA CO., LTD.

assignment · 99990418

Assignors

KONDO, TAKASHI, TANABE, HIDEKI, MIYAZAKI, MAKOTO, IDE, EIICHI, UCHINO, HIROSHI, NORITA, TOSHIO

On an employer assignment, the assignors are typically the inventors.

From the same owner

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