A SENSOR AND METHOD FOR MEASURING THE FREQUENCY OF A DESIRED RESONANT MODEOF A CRYSTAL ARRANGEMENT

Patent №

US 6,292,002

Granted

2001-09-18

Filed 1999

Owner

RAYTHEON COMPANY, A CORPORATION OF DELAWARE

Lab

AI components

1

planning

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

09375211

A method and apparatus for measuring the frequency of a desired resonant mode of a crystal arrangement, or other two-port device, during an automated operation. The crystal arrangement, or other two-port device, is placed into a test circuit and subjected to a sinusoidal test signal of known frequency. Based upon the output response of the crystal arrangement to the test signal, the frequency of the test signal is changed such that the test signal rapidly converges on a desired mode of operation of the crystal arrangement. This is accomplished by first noting a desired increase in amplitude of the output response of the crystal arrangement, followed by measuring an error signal related to the desired crystal arrangement mode of operation. When the error equals a predetermined value the frequency of the sinusoidal test signal is the frequency of the desired mode.

PlanningG01R 31/2824G01R 29/22

AI classification

Planning1.00
Vision0.01
Natural language0.00
AI hardware0.00
Machine learning0.00
Evolutionary computation0.00
Speech0.00
Knowledge representation0.00

Ownership

RAYTHEON COMPANY, A CORPORATION OF DELAWARE

assignment · 101860049

Assignors

PRINGLE, RALPH, MORGAN, FELIX E.

On an employer assignment, the assignors are typically the inventors.

© 2026 NYSGPT2525 LLC