A SENSOR AND METHOD FOR MEASURING THE FREQUENCY OF A DESIRED RESONANT MODEOF A CRYSTAL ARRANGEMENT
Patent №
US 6,292,002
Granted
2001-09-18
Filed 1999
Owner
RAYTHEON COMPANY, A CORPORATION OF DELAWARE
Lab
—
AI components
1
planning
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
09375211
A method and apparatus for measuring the frequency of a desired resonant mode of a crystal arrangement, or other two-port device, during an automated operation. The crystal arrangement, or other two-port device, is placed into a test circuit and subjected to a sinusoidal test signal of known frequency. Based upon the output response of the crystal arrangement to the test signal, the frequency of the test signal is changed such that the test signal rapidly converges on a desired mode of operation of the crystal arrangement. This is accomplished by first noting a desired increase in amplitude of the output response of the crystal arrangement, followed by measuring an error signal related to the desired crystal arrangement mode of operation. When the error equals a predetermined value the frequency of the sinusoidal test signal is the frequency of the desired mode.
AI classification
Ownership
RAYTHEON COMPANY, A CORPORATION OF DELAWARE
assignment · 101860049
Assignors
PRINGLE, RALPH, MORGAN, FELIX E.
On an employer assignment, the assignors are typically the inventors.