SYSTEM AND METHOD FOR NON-PARAMETRIC MODELING OF PROCESSED INDUCED VARIABILITY

Patent №

US 6,317,640

Granted

2001-11-13

Filed 1999

Owner

TEXAS INSTRUMENTS INCORPORATED

Lab

AI components

2

planning · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

09225877

Method for adequately modeling process induced variabilities is disclosed that comprises the steps of acquiring experimental data and defining a particular design space. Values for the mean and standard deviation of the experimental data at each of the points defining the design space are calculated. The experimental values of the output parameters at each of the design points is normalized to extract the shape of the distribution of each of the design points. The normalized values are then merged to form a cumulative distribution function associated with the data. The cumulative distribution function is applied to a new design point in a predicted fashion by first calculating a mean and standard deviation value for the new point by interpolating from the mean and standard deviation values from the experimental data. The cumulative distribution function is then scaled and centered using the interpolated mean and standard deviation values to provide a predicted data distribution for the new design point.

AI classification

AI hardware1.00
Planning1.00
Vision0.48
Knowledge representation0.04
Natural language0.01
Machine learning0.00
Speech0.00
Evolutionary computation0.00

Ownership

TEXAS INSTRUMENTS INCORPORATED

assignment · 97020862

Assignors

RAO, SURAJ, SAXENA, SHARAD, APTE, PUSHKAR P., MOZUMDER, PURNENDU K., BURCH, RICHARD GENE, VASANTH, KARTHIK, DAVIS, JOSEPH CARL, FERNANDO, CHENJING L.

On an employer assignment, the assignors are typically the inventors.

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