METHOD OF ANALYZING STATIC CURRENT TEST VECTORS WITH REDUCED FILE SIZES FOR SEMICONDUCTOR INTEGRATED CIRCUITS

A method and apparatus are provided for analyzing test vectors for use in measuring static current consumed by an integrated circuit. A netlist of interconnected cells is read to identify cell types used within the netlist, wherein the netlist includes a plurality of nodes. Once the netlist has been read, cell characteristics for selected ones of the cell types are read from a technology library to identify pins of the selected cell types to be monitored. The nodes in the netlist that correspond to these pins are identified and are added to an list file. Once the list file has been generated, a computer simulation program is used to simulate a steady-state response of a functional model of the integrated circuit to a potential test vector and to output the resulting logic states on the nodes provided in the list file.