MICROPATTERN MEASURING METHOD AND APPARATUS, AND RECORDING MEDIUM THAT RECORDS MICROPATTERN MEASURING PROGRAM
Patent №
US 6,480,807
Granted
2002-11-12
Filed 2000
Owner
KABUSHIKI KAISHA TOSHIBA
Lab
—
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
09665942
An image acquiring section acquires a pattern image of a sample. A figure creating section creates a figure, which reflects a shape of the micropattern, on the basis of the pattern image. A density distribution data acquiring section acquires density distribution data on a straight line perpendicular to a tangential line of an outline of the figure. An edge detecting section detects pattern edge coordinates from the density distribution data. A pattern shape measuring section measures a shape of the micropattern on the basis of the pattern edge coordinates.
AI classification
Ownership
KABUSHIKI KAISHA TOSHIBA
assignment · 111380286
Assignors
MIYANO, YUMIKO
On an employer assignment, the assignors are typically the inventors.