MICROPATTERN MEASURING METHOD AND APPARATUS, AND RECORDING MEDIUM THAT RECORDS MICROPATTERN MEASURING PROGRAM

Patent №

US 6,480,807

Granted

2002-11-12

Filed 2000

Owner

KABUSHIKI KAISHA TOSHIBA

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

09665942

An image acquiring section acquires a pattern image of a sample. A figure creating section creates a figure, which reflects a shape of the micropattern, on the basis of the pattern image. A density distribution data acquiring section acquires density distribution data on a straight line perpendicular to a tangential line of an outline of the figure. An edge detecting section detects pattern edge coordinates from the density distribution data. A pattern shape measuring section measures a shape of the micropattern on the basis of the pattern edge coordinates.

VisionG01B 11/00G01B 11/002G06T 7/0006G06T 7/62G06T 2207/30148H01J 2237/2817

AI classification

Vision0.89
Planning0.01
Natural language0.01
Evolutionary computation0.00
AI hardware0.00
Machine learning0.00
Knowledge representation0.00
Speech0.00

Ownership

KABUSHIKI KAISHA TOSHIBA

assignment · 111380286

Assignors

MIYANO, YUMIKO

On an employer assignment, the assignors are typically the inventors.

From the same owner

© 2026 NYSGPT2525 LLC