STRUCTURE TO INSPECT HIGH/LOW OF MEMORY CELL THRESHOLD VOLTAGE USING CURRENT MODE SENSE AMPLIFIER

A structure to inspect high/low of memory cell threshold voltage using a current mode sense amplifier. A current mode sense amplifier is used to compare a memory cell current of a selected memory cell and a reference current to determine high/low of the threshold voltage. Since the current input is compared, it is not necessary to provide a reference word line and a reference memory cell circuit. The area is thus decreased, and the waiting time to convert current to voltage is saved to greatly increase the access speed.