OPTICAL SYSTEM FOR DETECTING SURFACE DEFECT AND SURFACE DEFECT TESTER USING THE SAME
Patent №
US 6,509,966
Granted
2003-01-21
Filed 2001
Owner
HITACHI ELECTRONICS ENGINEERING CO., LTD.
Lab
—
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
09907713
A defect detection optical system includes a light receiving system including n light receiving elements arranged in a direction perpendicular to a main scan direction, for focusing an image thereon such that the image becomes in the arranging direction of the light receiving elements, in which, when a width of the image focused thereon in the main scan direction is equal to or smaller than the width of the light receiving elements, light reflected from a recessed or protruded defect is swung in the width direction of the light receiving elements and a light receiving area of the light receiving elements is reduced. When the reflection light from the recessed or protruded defect is; swung in sloped portions of the defect, an amount of light received by the light receiving elements is at least reduced, so that two detection signals having levels lower than those when there is no defect are obtained.
AI classification
Ownership
HITACHI ELECTRONICS ENGINEERING CO., LTD.
assignment · 133460632
Assignors
ISHIGURO, TAKAYUKI
On an employer assignment, the assignors are typically the inventors.