GENERATING AND CONTROLLING ANALOG AND DIGITAL SIGNALS ON A MIXED SIGNAL TEST SYSTEM

Patent №

US 6,512,989

Granted

2003-01-28

Filed 1999

Owner

LTX CORPORATION

Lab

AI components

2

planning · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

09276849

An automated test system that has analog and digital resources for testing mixed signal ICs. A control pattern is provided that is used by the automated test system to simultaneously control both the digital resources and the analog resources. The control pattern is comprised of a sequentially executed two-dimensional array with columns corresponding to analog and digital resources. The automated test system uses the control pattern to control both the analog and digital resources.

PlanningAI hardwareG01R 31/31917G01R 31/3167

AI classification

AI hardware0.69
Planning0.57
Knowledge representation0.01
Machine learning0.00
Natural language0.00
Evolutionary computation0.00
Speech0.00
Vision0.00

Ownership

LTX CORPORATION

assignment · 100080564

Assignors

DEOME, MARK, DEOME, MARK, ORGAN, DONALD V.

On an employer assignment, the assignors are typically the inventors.

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