GENERATING AND CONTROLLING ANALOG AND DIGITAL SIGNALS ON A MIXED SIGNAL TEST SYSTEM
Patent №
US 6,512,989
Granted
2003-01-28
Filed 1999
Owner
LTX CORPORATION
Lab
—
AI components
2
planning · hardware
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
09276849
An automated test system that has analog and digital resources for testing mixed signal ICs. A control pattern is provided that is used by the automated test system to simultaneously control both the digital resources and the analog resources. The control pattern is comprised of a sequentially executed two-dimensional array with columns corresponding to analog and digital resources. The automated test system uses the control pattern to control both the analog and digital resources.
AI classification
Ownership
LTX CORPORATION
assignment · 100080564
Assignors
DEOME, MARK, DEOME, MARK, ORGAN, DONALD V.
On an employer assignment, the assignors are typically the inventors.