Patent №
US 6,571,371
Granted
2003-05-27
Filed 2000
Owner
ADVANCED MICRO DEVICES, INC.
Lab
—
AI components
2
ml · planning
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
09749293
The present invention provides for a method and an apparatus for using a latency time period as a control input parameter. A manufacturing run of semiconductor devices is processed. Metrology data from the processed semiconductor devices is acquired. A latency analysis process is performed using the acquired metrology data. A feedback/feed-forward modification process is performed in response to the latency analysis process.
AI classification
Ownership
ADVANCED MICRO DEVICES, INC.
assignment · 114240428
Assignors
COSS, JR., ELFIDO, CONBOY, MICHAEL R., HENDRIX, BRYCE
On an employer assignment, the assignors are typically the inventors.