APPARATUS FOR OPTIMIZED CONSTRAINT CHARACTERIZATION WITH DEGRADATION OPTIONS AND ASSOCIATED METHODS
Patent №
US 6,584,598
Granted
2003-06-24
Filed 2001
Owner
SILICON METRICS CORPORATION
+1 more
Lab
—
AI components
1
hardware
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
09904463
A circuit-characterization system includes a computer. The computer uses a model of an operation of the circuit to characterize first and second constraints of the circuit and to select values for the first and second constraints, respectively. The computer modifies the values selected for the first and second constraints to obtain optimized values for the first and second constraints. The optimized values of the first and second constraints avoid an invalid region of operation of the circuit.
AI classification
Ownership
SILICON METRICS CORPORATION
assignment · 120150675
SYNOPSYS, INC.
assignment · 291610846
Assignors
RAO, GURUPRASAD G., HOWICK JR., E. KEITH
On an employer assignment, the assignors are typically the inventors.